6x. Sun, A. A1 imohammad, and P. Trouborst. Model ing of FPGA Local Interconnect Resources and Derivation of Minimal Test Configurations[ J] .2002,Proc. 17'h IEEE Int. Syrup. Defect and Fault Tolerance in VLSI System: 284-292.
7T.M.S.Ummu Salima, A. Askarunisha, N. Ramaraj, Enhancing the Efficiency of Regression Testing through In- telligent Agents [ C ] //Proceedings of the International Conference on Computational Intelligence and Multimedia Applications, 2007 : ! 03-108.
