基于V93000的千万门级SRAM型FPGA测试技术研究

Research on the Test Technology of Ten Million Gate SRAM FPGA Based on V93000

随着集成电路技术和工艺的突飞猛进,FPGA器件正朝向高速、高密度、高带宽、低功耗的趋势发展。在设计和制造大规模SRAM型FPGA器件的同时,如何高效率、高覆盖率和低成本测试FPGA器件显得尤为重要。该文以Xilinx厂家的Kintex-7系列FPGA电路为研究对象,通过研究SRAM型FPGA测试方法,利用V93000自动测试系统实现对千万门级FPGA进行在线压缩配置,建立完备的测试开发流程,完成各项参数、功能测试,实现量产测试程序开发。为后续亿门级FPGA和其他大规模数字集成电路测试开发提供了新思路。

With the rapid advancement of integrated circuit technology and process,FPGA devices are moving towards the trend of high speed,high density,high bandwidth,and low power consumption.While designing and manufacturing large-scale SRAM FPGA devices with high efficiency,high coverage and low cost is particularly important.This article takes the Kintex-7 series FPGA circuit of Xilinx manufacturer as the research object.Use the V93000 automatic test system to realize on-line compression configuration of tens of millions of FPGAs,establish a complete test development process,complete various parameter and functional tests,and realize mass production test program development.It provides new ideas for the subsequent test and development of billion-gate FPGA and other large-scale digital integrated circuits.