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某电动车型真空泵驱动芯片击穿问题分析与解决办法

Analysis and Solution about the Breakdown of the Vacuum Pump's Driving Chip Involving an Electric Vehicle
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摘要 针对某电动车型在整车下电瞬间出现真空泵控制器驱动芯片击穿短路导致的真空泵不停机问题,通过理论及HIL台架测试数据分析发现驱动芯片击穿与真空泵停止瞬间产生的反向电动势有关。同时结合实车故障复现模式,分析故障发生机理,在真空泵两端并联一个续流二极管对真空泵停止瞬间产生的反向电动势进行吸收,并顺利通过HIL测试、实车验证及台架加速耐久测试,最终问题得到解决。 Aiming at the problem occurred at the moment of a certain vehicle powered off,that the vacuum pump controller driver chip had a breakdown and a short circuit,then the vacuum pump did not stop after the vehicle was powered off,Through theoretical and HIL bench test data analysis showed that the driver chip breakdown was related to the reverse electromotive force generated by the instant of the vacuum pump stopped.At the same time,combined with the actual vehicle fault recurrence mode,the failure mechanism was analyzed,and a rectifier diode was connected in parallel at both ends of the vacuum pump to absorb the reverse electromotive force generated at the instant of the vacuum pump stopped,and successfully passed the HIL test,the real car test and the accelerated durability bench test.At last this problem was solved.
作者 张汝琳 古晓科 赵小杰 张全成 王新辉 ZHANG Ru-lin;GU Xiao-ke;ZHAO Xiao-jie;ZHANG Quan-cheng;WANG Xin-hui(Zhengzhou Nissan Automobile Co.,ltd,nev Division,Zhengzhou 450046,China)
出处 《汽车科技》 2020年第6期36-40,共5页 Auto Sci-Tech
关键词 驱动芯片 续流二极管 反向电动势 Driver Chip Rectifier Diode Reverse Electromotive
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