集成电路双面老炼方案研究

Research of Integrated Circuit’s Domestic Burn-in Experiment with Double-side Board

动态老炼试验是元器件可靠性试验中极为重要的过程,通过老炼可以剔除早期失效元器件。本论文简单介绍了老炼试验的重要性、实现方式及特点,并结合提出了两种双面老炼板工艺效率改进方案,均能在不增购老炼设备的前提下将老炼效率提升80%以上,并通过实践验证了其可行性。

Domestic burn-in experiment is extremely important in evaluating the reliability of integrated circuits,components with initial failure could be eliminated through the experiment.The importance,implementation and characteristic of burn-in experiment is illustrated,and two implement method of double-side(layer)board used to improve burn-in efficiency is proposed.Either of the two method could improve burn-in efficiency by 80%at least without buying extra burn-in equipment,and the feasibility has been proved through practical application.