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近代物理研究所微束探针形成系统的现代化研究

Modernization of Probe-forming System of IMP Microbeam
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摘要 Ion beam analysis and modification of different materials provide numerous possibilities for applications of these techniques.Additional advantages are gained from a focusing of ion beam into a micron size probe in a microbeam facility.However,most microbeams are utilized H^(+),He^(2+)beams of several MeV energy.At the same time,high energy heavy ions(HEHI)microbeams of tens to hundred MeV/u are becoming more popular for studies of the spatial radiation response or local radiation effect in the samples.Widening of their application area demands addition study of HEHI interaction with a matter as well as improvement of the microbeam parameters.
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出处 《IMP & HIRFL Annual Report》 2017年第1期171-172,共2页 中国科学院近代物理研究所和兰州重离子研究装置年报(英文版)
基金 CAS President’s International Fellowship Initiative(PIFI)。
关键词 BEAM PROBE gained
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