宽量程光电传感器I-U特性测试系统设计

Design of I-U characteristic test system for wide range photoelectric sensor

针对光电传感器I-U特性测试过程中输出信号易受外界噪声影响、量程有限的问题,结合高精度数字源表和小波变换,设计一个宽量程光电传感器I-U特性测试系统,其包括数据采集、数据处理和数据显示3个模块。使用高精度数字源表实现数据的采集,结合LabVIEW与Matlab实现数据处理功能,最后在数据显示模块中对结果进行显示和保存。通过仿真实验确定合适的小波基函数和最优分解层数,使输出信号的信噪比最高且失真度最小。分析实际测试结果可知,所设计的宽量程光电传感器I-U特性测试系统可以完成输出电流为纳安、微安、毫安光电传感器IU特性的测试工作,且小波去噪能够有效去除信号中的噪声,对于传感器等输出电流微弱元器件的测试工作有一定的借鉴意义。

For the problem about the output signal is easily affected by external noise and the range is limited in the process of I-U characteristic test of photoelectric sensor,combined with high-precision digital source meter and wavelet transform,an I-U characteristic test system for wide range photoelectric sensor is designed,which includes three modules:data acquisition,data processing and data display.High-precision digital source meter is used to realize data acquisition,data processing function is realized through the combination of LabVIEW and Matlab,and finally the results are displayed and saved in the data display module.The appropriate wavelet basis function and decomposing level were determined by simulation experiments to improve the signal-to-noise ratio of the output signal.The analysis of the experimental results shows that the IU characteristic test system can complete the measurement of the I-U characteristics of the photoelectric sensors with output current of nanoampere,microampere and milliampere,and the wavelet de-noising can effectively remove the noise in the signal.It can be used for reference for testing components with weak output current.