摘要
阐述在自动测试设备ATE中,将标准测试数据格式STDF转换成本文测试数据格式ATDF,直观认识测试数据的结构和内容,实现测试数据的收集、清洗、存储、分析与挖掘的产业化解决方案。
In this paper, by converting STDF into ATDF, the structure and content of test data can be more intuitively understood in ATE, and the industrial solution of collection, cleaning, storage, analysis and mining of test data can be realized.
作者
王玉龙
WANG Yulong(Sino IC Technology Co.,Ltd,Shanghai 201203,China)
出处
《集成电路应用》
2020年第11期26-27,共2页
Application of IC