多层瓷介电容常见失效模式及失效机理研究

Study on Common Failure Mode and Failure Mechanism of Multilayer Ceramic Dielectric Capacitor

电容器主要的电参数为电容值、绝缘电阻、击穿电压以及损耗角正切值。引起陶瓷电容器上述电参数超差失效的原因通常为损耗性失效、过应力失效、内部缺陷以及外部缺陷引起的失效四类。本文对典型失效模式短路、开路以及电参数漂移相应的微观失效机理及失效原因展开了深入研究,并提出了相应建议和预防措施。

The main electrical parameters of a capacitance are capacitance value,insulation resistance,breakdown electricity and tangent value of reported consumption angle.The over difference failure of the above electrical parameters of ceramic capacitors is usually caused by wear-out failure and over-pedestal force effect.The interior is pure trapped to and four types of failure of caused by external depression.In the paper,the microcosmic failure mechanism and failure causes of short loss mode,open mode and deep shift of electrical parameters are deeply studied,and the corresponding niche theory and preventive measures are put forward.