摘要
为了解决电子元器件在使用过程中因硫化而失效的问题,通过对片式电阻器、轻触开关、继电器、LED光电器件的硫化失效原因以及硫化失效机理的研究与分析,提出应尽快建立电子元器件抗硫化评价体系,为装备提供高质量和高可靠的元器件奠定基础.
Through the research and analysis of the causes of vulcanization failure and vulcanization failure mechanism of chip resistors,tact switches,relays,and LED optoelectronic devices,it is proposed that the anti-sulfurization evaluation system of electronic components should be established as soon as possible to provide high-quality and highly reliable equipment for equipment.
出处
《信息技术与标准化》
2021年第1期74-77,共4页
Information Technology & Standardization
关键词
电子元器件
硫化
评价体系
electronic components
sulfurization
evaluation system
