基于静态随机存取存储器型FPGA的测试技术发展

Progress of Static Random Access Memory-based FPGA Testing

可编程逻辑门阵列(FPGA)技术迅速发展,广泛应用于各种电子系统中,与此同时,对FPGA测试的需求也日益增多。针对FPGA的测试方法和特性进行综述研究,给出了测试对象FPGA的分类,根据FPGA的类型特点说明其测试重点,并着重介绍了目前应用最广泛的基于静态随机存取存储器(SRAM)型FPGA的内部资源结构。重点针对SRAM型FPGA,对相应的现有测试方法进行了分类与特性分析。最后对测试技术的发展方向进行了展望。

With the rapid development of programmable logic gate array(FPGA)technology and its wide application in various fields,the demand of FPGA testing is increasing,so the recent research on FPGA testing were summarized.Different types of FPGA were introduced according to their respective characteristics and their internal resource structure.It focused on the demonstration of SRAM-based FPGAs.Moreover,existing test methods and technologies on SRAM-based FPGA were analyzed and summarized.Furthermore,the prospect of FPGA testing technology was provided.