失效电子元器件分析方法

Analysis Method for Failed Electronic Components

介绍了一种电子元器件失效分析方法,给出了失效器件失效的统计要素,并对失效要素进行分析、研究失效模式与失效机理,找出失效原因,找到生产过程中的薄弱环节,制定相应措施,及时有效预防器件的再次失效,提高电子元器件的使用可靠性,进而提高整机可靠性,以较小的质量成本获取较高的经济效益,避免产品出现重复性问题,最终达到控制质量成本的目的。

This paper introduces a kind of electronic components failure analysis method,discusses the failure device statistical factors,and analyze the factors of failure,the invalidation mode failure mechanism,the failure reasons,fi nd the weak link in the process of production,make corresponding measures,timely and effective prevention device failure again,improve the using reliability of electronic components,and thus enhance the reliability,with smaller quality cost to obtain higher economic effi ciency,avoid repetitive problems products,eventually achieve the goal of controlling quality cost.