一阶动态电路暂态过程分析及其仿真测试

Analysis and simulation testing on transient process of first⁃order dynamic circuit

针对一阶动态电路暂态过程的实验室测量存在测试欠便捷全面及不易测试的弊端,在对一阶动态电路暂态过程分析的基础上,研究将Multisim仿真引入其测试中。利用Multisim参数扫描分析功能,实现在方波激励下方便全面地测试元件参数变化时的所有响应,将实验室不可能同时观测的波形集于一体;利用Multisim瞬时分析仿真功能,研究正弦激励下暂态过程的过电压情况测试,弥补了实验室观测不到的缺陷,从而有利于防范实际工程的过电压危害。测试结果表明,该电路仿真与理论分析一致,仿真测试便捷直观,仿真效果理想,对动态电路暂态过程的应用有着重要意义。

Since the laboratory measurement of the transient process of first⁃order dynamic circuit has the disadvantages of inconvenient,incomprehensive and difficult test,the Multisim simulation is introduced into its test on the basis of the analysis of the transient process of first⁃order dynamic circuit.The convenient and comprehensive test for all responses when the element parameters change under the square wave excitation can be realized by means of the parameter scanning analysis function of the Multisim,by which the waveforms that cannot be observed simultaneously in the laboratory are integrated.The testing of the overvoltage condition in the transient process under the sinusoidal excitation is researched by means of the transient analysis simulation function of Multisim,which makes up the defect that the laboratory is not easy to observe,so as to prevent the overvoltage hazard of the actual projects.The testing results show that the circuit simulation is consistent with the theoretical analysis,the simulation test is convenient and intuitive,and the simulation effect is ideal,which has practical significance for the application of transient process of dynamic circuit.