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Tracks Formation and Morphology in GaN Induced by Swift Heavy Ions

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摘要 GaN single crystals were irradiated by 129Xe and 209Bi ions in the range of 800~2300 MeV,respectively.The samples were studied by transmission and high-resolution electron microscope and Raman spectroscopy to reveal the tracks and defects induced in the samples after the irradiation process.
机构地区 不详
出处 《IMP & HIRFL Annual Report》 2019年第1期109-110,共2页 中国科学院近代物理研究所和兰州重离子研究装置年报(英文版)
关键词 GAN process. SWIFT
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