Geant4 Simulation of Neutron-induced Single Event Upset in a Three Dimension Die-stacked SRAM

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摘要 In the fields of commercial aerospace,earth orbit satellite,Mars exploration,and aviation,the single event effect(SEE)caused by neutron has attracted much attention in recent years.3D ICs are increasing favored aerospace.

作者 Mo Lihua Ye Bing Liu Jie Sun Youmei

机构地区不详

出处《IMP & HIRFL Annual Report》 2019年第1期111-112,共2页 中国科学院近代物理研究所和兰州重离子研究装置年报（英文版）

关键词 GEANT4 EARTH DIMENSION

分类号 O57 [理学—粒子物理与原子核物理]

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Geant4 Simulation of Neutron-induced Single Event Upset in a Three Dimension Die-stacked SRAM

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