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低维光电材料缺陷与界面增强拉曼散射 被引量:2

Defects-and interface-enhanced Raman scattering in low-dimensional optoelectronic materials
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摘要 近年来,一系列新型低维光电材料相继涌现,展现出优异的性能。这些光电材料与表面增强拉曼散射(SERS)技术相结合,显示出巨大的应用潜力,有望成为高灵敏SERS活性基底。缺陷与界面调控是低维光电材料SERS应用的重要策略,本文将重点介绍新型低维光电材料缺陷与界面增强拉曼散射的种类和增强机理。通过对缺陷与界面增强拉曼散射的应用和研究前景的展望,启发人们对SERS研究的再思考和再认识。 In recent years,a series of new low-dimensional optoelectronic materials with excellent properties have emerged.Combined with surface-enhanced Raman scattering(SERS)technology,they show great application potential and are expected to become highly sensitive SERS substrates.Defects and interface regulation of low-dimensional optoelectronic materials are important strategies for their applications in SERS technology.In this paper,the types and enhancement mechanisms of defects-and interface-enhanced Raman scattering in new low-dimensional optoelectronic materials are introduced.By looking forward to the application and research prospect of defects-and interface-enhanced Raman scattering,this work might inspire people to reconsider and further understand the study of SERS.
作者 侯翔宇 邱腾 HOU Xiang-yu;QIU Teng(School of Physics,Southeast University,Nanjing 211189,China)
出处 《中国光学》 EI CAS CSCD 北大核心 2021年第1期170-181,共12页 Chinese Optics
基金 国家自然科学基金面上项目(No.11874108) 国家重点研发计划项目(No.2017YFA0403600)。
关键词 缺陷 界面 表面增强拉曼散射 低维光电材料 defects interface surface-enhanced Raman scattering low-dimensional optoelectronic materials
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