摘要
先进同步辐射光源具有高通量、高相干性、高脉冲重复率等优点,将基于其的X射线衍射、小角散射、成像、谱学等表征方法与原位环境(如温度场、应力场、气氛、溶液介质等)实验装置配合,可为系统表征与评价核能系统用材料与部件的服役行为和损伤机制提供重要技术手段。核材料在高温/应力/介质/中子辐照等复杂多场环境下的服役损伤行为长期以来一直是学术界和工业界关注的焦点,其中多场耦合作用下材料微观结构演化、微观力学行为及微观损伤机制是亟需解决的关键科学问题。分别从同步辐射高能X射线衍射、微束衍射技术、小角散射技术、成像技术、谱学技术等几个方面,介绍了同步辐射表征技术在典型核材料研究中的应用。最后基于国内外在核材料领域的研究进展,展望了同步辐射技术在核材料研究中的未来发展方向。
The advanced synchrotron radiation source,with the advantages of high flux,high coherence,high pulse repetition rate,etc.,provides characterization methods such as X-ray diffraction,small-angle scattering,imaging,and spectroscopy.The in-situ environmental(such as temperature field,stress field,gas,solution medium,etc.)equipment combined with these characterization methods are important technical means for the measurement and evaluation of the service behavior and damage mechanism of materials and components used in nuclear energy systems.The damage behavior of nuclear materials under complex multi-field environments such as temperature/stress/medium/neutron irradiation has long been the focus of the academic and industrial circles.The microstructure evolution,micromechanical behavior and damage mechanism of nuclear materials under the coupling action of multiple fields are the key scientific issues.This paper reviews the application of synchrotron radiation characterization techniques in the research of typical nuclear materials from several aspects,such as high-energy X-ray diffraction,microbeam diffraction,small-angle scattering,imaging/tomography,and spectroscopy.Finally,the future development directions of synchrotron radiation technology in nuclear materials research are prospected.
作者
李时磊
王沿东
王胜杰
徐宁
李阳
LI Shilei;WANG Yandong;WANG Shengjie;XU Ning;LI Yang(State Key Laboratory for Advanced Metals and Materials,University of Science and Technology Beijing,Beijing 100083,China)
出处
《中国材料进展》
CAS
CSCD
北大核心
2021年第2期120-129,111,共11页
Materials China
基金
国防科技工业核材料技术创新中心项目(ICNM-2020-ZH-04)
中央高校基本科研业务费专项资金资助项目(FRF-BD-2002B)。
关键词
同步辐射
核材料
X射线衍射
小角X射线散射
X射线成像
synchrotron radiation
nuclear materials
X-ray diffraction
small angle X-ray scattering
X-ray imaging