氩离子抛光-场发射扫描电镜分析方法在识别有机显微组分中的应用

Ar-ion polishing FE-SEM analysis of organic maceral identification

氩离子抛光—场发射扫描电镜是页岩储层微观孔隙结构表征的常用手段,但单独依靠扫描电镜观察无法直接识别有机质类型,而荧光显微镜是鉴定显微组分的主要方法。通过大量场发射扫描电镜与荧光显微镜相结合的定位观察技术,实现对扫描电镜下特定显微组分的鉴定和观察,并总结出扫描电镜下有机显微组分鉴定的方法和特征。氩离子抛光—场发射扫描电镜下,可通过有机质的外部形态、硬度、亮度、颜色、突起、有机质孔隙发育特征以及裂隙发育特征等综合判断出结构镜质体、无结构镜质体、镜屑体、丝质体、半丝质体、菌类分泌体、惰屑体、油沥青以及焦沥青。

Argon-ion polishing field emission-scanning electron microscopy(FE-SEM)is a common method to characterize the microscopic pore structure characteristics of shale reservoirs,but organic macerals cannot be directly identified by FE-SEM alone.Fluorescence microscopy is the main method for identifying macerals.Through a large number of localized FE-SEM and fluorescence microscopy observations,the microscopic characteristics of specific macerals under FE-SEM were summarized.The macerals visualized using FE-SEM can be interpreted based on features such as the external shape,hardness,brightness,color,relief,organic pore development characteristics and fissure development characteristics of the organic matter.Telinite,collotelinite,vitrodetrinite,fusinite,semifusinite,funginite,inertodetrinite,oil bitumen and pyrobitumen were identified.