摘要
齿轮齿廓偏差是齿轮检定中的重要参数之一。文章采用新型复合齿轮线结构光测量系统,对一级标准(u=1μm,k=3)齿轮渐开线样板的齿廓进行了测量,从机、热、光、电等多个方面分析了测量误差的来源,并以JJF1059.1-2012《测量不确定度评定与指南》为基础,评定了用该系统测量齿轮齿廓偏差的不确定度。研究表明,用该测量系统测量齿轮齿廓时存在误差,包括:仪器测量重复性误差、渐开线样板标准量误差、样板线膨胀误差、顶尖同轴度误差、齿轮安装偏心误差、线结构光系统误差等,其中CCD相机标定误差、结构光视觉模型标定误差以及线结构光光条中心检测误差所引起的合成标准不确定度为0.98μm,是新型复合齿轮线结构光测量系统误差的主要来源,并通过分析计算得到该测量系统扩展不确定度为2.3μm(k=2),可以满足测量精度在2.3μm以上的齿轮测量。
Gear tooth profile deviation is one of the important parameters in gear verification.A new type of composite gear line structured light measurement system is used to measure the tooth profile of the first-level standard(u=1μm,k=3)gear involute template,and analyzes from the mechanical,thermal,optical,and electrical aspects.The source of measurement error,and based on JJF1059.1-2012"Measuring Uncertainty Evaluation and Guidelines",evaluated the uncertainty of measuring gear tooth profile deviation with this system.Research shows that there are errors when using this measuring system to measure gear tooth profile,including:instrument measurement repeatability error,involute model standard error,model linear expansion error,center coaxiality error,gear installation eccentricity error,line structure Optical system error,etc.The combined standard uncertainty caused by CCD camera calibration error,structured light vision model calibration error and line structured light strip center detection error is 0.98μm,which is the main error of the new composite gear line structured light measurement system Source,and through analysis and calculation,the extended uncertainty of the measurement system is 2.3μm(k=2),which can meet the gear measurement with a measurement accuracy of 2.3μm or more.
作者
赵运才
王得峰
余石鹏
任继华
ZHAO Yuncai;WANG Defeng;YU Shipeng;REN Jihua(Jiangxi University of Science and Technology Mechanical and Electrical Engineering,Jiangxi 341000,China;Dongguan Xinghuo Gear Co.,Ltd.,Dongguan 523000,China)
出处
《光学技术》
CAS
CSCD
北大核心
2021年第1期50-55,共6页
Optical Technique
基金
国家重点研发计划项目资助(2018YFB2001400)。
关键词
齿廓
新型复合齿轮线结构光测量系统
渐开线样板
测量不确定度
tooth profile
new composite gear line structured light measurement system
involute model
measurement uncertainty