摘要
利用酸辅助一锅法合成了形貌均一的三氧化钨方形纳米片。通过扫描电子显微镜(SEM)、透射电子显微镜(TEM)和紫外漫反射吸收光谱(UV-DRS)对材料的形貌结构和均一性进行表征。由X射线光电子能谱分析(XPS)与X射线衍射(XRD)对材料中的元素和价态表征可知,成功制备了三氧化钨纳米片,并发现其表面具有一定的氧缺陷。将该材料作为表面增强拉曼散射(Surface-enhanced Raman scattering,SERS)基底,对不同浓度结晶紫(CV)进行了检测,并经统计计算得到了917 cm^(-1)处特征峰的相对标准偏差(RSD)值为16.13%,表明该基底具有较高的重复性。
Tungsten trioxide square nanosheets were prepared via acid-assisted one-pot process.Morphology structure and homogeneity of the materials were characterized by scanning electron microscope(SEM),transmission electron microscope(TEM)and ultraviolet-visible diffuse reflection spectrum(UV-DRS).According to the X-ray photoelectron spectroscopy(XPS)and X-ray diffraction(XRD)analysis of the elements and states in the material,the tungsten trioxide nanosheets were successfully prepared and some oxygen defects were found on the surface.Using this material as the surface-enhanced Raman scattering(SERS)substrate,different concentrations of crystal violet(CV)was detected,and the relative standard deviation(RSD)value of 917 cm^(-1)characteristic peak was 16.13%,indicating that the substrate had high repeatability.
作者
孙宗杰
林东岳
何遥
孙宇峰
杨良保
SUN Zongjie;LIN Dongyue;HE Yao;SUN Yufeng;YANG Liangbao(Anhui Polytechnic University, Anhui, Wuhu 241000, China;Center of Medical Physics and Technology, Hefei Institutes of Physical Science, Chinese Academy of Sciences, Hefei 230031, China)
出处
《光散射学报》
2020年第4期320-327,共8页
The Journal of Light Scattering
基金
国家自然科学基金(61605221)。
关键词
三氧化钨
表面增强拉曼散射
基底
氧缺陷
Tungsten trioxide
Surface-enhanced Raman scattering
Substrate
Oxygen defects
