扫描电子显微镜在沉淀法白炭黑研究中的应用现状与展望

Application Status and Development of SEM in Study of Precipitated Silica

介绍扫描电子显微镜(简称扫描电镜)的特点和测试原理及其在沉淀法白炭黑研究中的应用。与透射电子显微镜相比,扫描电镜可以获得更准确的沉淀法白炭黑微观结构,且价格适中,易于操作,结果分析简单。扫描电镜用于沉淀法白炭黑制备研究中可以获得沉淀法白炭黑粒子大小、团聚体形貌和孔结构等微观结构信息,用于沉淀法白炭黑改性研究中可以观测改性效果,用于沉淀法白炭黑/橡胶复合材料研究中可以表征沉淀法白炭黑在复合材料中的分散程度。

The characteristics and testing principle of scanning electron microscope(SEM) and its application in the study of precipitated silica were introduced. Compared with transmission electron microscope,SEM could provide more accurate microstructure of the precipitated silica with moderate price,easy operation and simple result analysis. With SEM,the microstructure information of the precipitated silica,such as the particle size,aggregate shape and pore structure,could be obtained. SEM could be used to observe the modification effect in the study of precipitated silica modification. SEM could also be applied to characterize the dispersion of the precipitated silica in the study of precipitated silica/rubber composites.