采用XRF方法准确测定Yb:YAG晶体组分

Accurate determination of Yb:YAG crystal components by XRF method

针对目前普遍存在的难以准确测定晶体组分的问题,提出一种以YAG晶体为标样、采用X射线荧光光谱分析法准确测定晶体组分的方法。测试样品分别为纯YAG晶体、生长原料掺杂浓度1.2 at%和2.0 at%Yb:YAG晶体,采用X射线荧光光谱分析法,对不同浓度的Yb:YAG晶体的组分进行了无损、快速、准确的测定。以纯YAG晶体作为标准样品,标定主成分的含量,大幅提高了检测结果的准确度,主成分Y^(3+)和Al^(3+)的测试误差小于1%、掺杂Yb3+的测试误差小于5%。通过晶体放肩初始部位Yb^(3+)的浓度测定结果,计算出Yb^(3+)在两种待测晶体中的分凝系数分别为1.025和1.045,接近于1,有利于实现Yb:YAG晶体的高浓度掺杂以及优质晶体生长。2.0 at%Yb:YAG晶体的首尾掺杂浓度差小于5%,说明晶体等径部分掺杂浓度均匀性高。

In order to solve the problem that it is difficult to accurately determine the crystal composition,a method for the accurate determination of crystal composition by X-ray fluorescence spectrometry with YAG crystal as the standard sample is developed.The samples are pure YAG crystal,and the doping concentration of raw materials with 1.2 at%and 2.0 at%Yb:YAG crystals.The composition of Yb:YAG crystals with different concentration is determined by X-ray fluorescence spectrometry.Using pure YAG crystal as the standard sample,the accuracy of the detection results is greatly improved.The detection error of main components Y^(3+)and Al^(3+)is less than 1%,and that of Yb^(3+)is less than 5%.The results show that the segregation coefficient of Yb^(3+)in the crystal are 1.025 and 1.045,which are close to 1.It is conducive to the realization of high concentration doping and high quality crystal growth of Yb:YAG crystal.The doping concentration difference of 2.0 at%Yb:YAG crystal is less than 5%,which indicates that the doping concentration uniformity of equal diameter part is high.