MCU集成中的CAN IP缺陷分析与仿真解决

Analysis and Simulation Solution of CAN IP Defect in MCU

CAN总线是一种应用广泛的现场总线,特别是在汽车领域。越来越多的MCU芯片集成了CAN总线模块,以扩大MCU的应用范围和覆盖领域。本文阐述了在MCU中集成CAN IP时,FPGA验证阶段CAN IP缺陷的分析和解决方法。

CAN bus is a widely used field bus,especially in the automotive field.More and more MCU chips integrate CAN bus modules to expand the scope and coverage of MCU applications.This article describes the analysis and solutions of CAN IP defects in FPGA verification phase when CAN IP is integrated in MCU.