期刊文献+

按压修复异物晕不良的影响因素 被引量:1

Influence factors of pressing repair for particle gap
下载PDF
导出
摘要 根据异物晕不良形成原因及修复方法,分析了成盒盒厚及压头直径对不良修复成功率的影响因素。当面板盒厚大小不同时,在相同压力值下修复成功率存在差异,不同盒厚产品对应的修复最佳压力值大小并不相同。面板盒厚越小达到最佳修复效果所需的压力值越大,反之亦然。压头直径的变化直接影响作用在基板表面的压强,随着压强增加,修复成功率先增后减,碎屏率在一定压强后显著增加。研究表明,在实际生产中对异物晕不良进行按压修复时,需针对不同型号的产品盒厚找出合适的压力,并通过达到最佳效果所需的压强找出合适的压头,以保障良好的修复效果。 Based on the causes and repair methods of particle gap,this paper analyzes the influence factors about the cell gap and head diameter for success rate.When the cell gap is different,the same pressure value has different success rate.The different cell gap has the differentiation of the optimal pressure value.When the cell gap is small,the pressure value required to achieve the best repair effect is larger,and vice versa.The change in the diameter of head directly affects the intensity of pressure acting on the TFT-LCD surface.With the intensity of pressure increasing,the success rate first increases and then decreases.The broken screen rate increases significantly after a certain pressure.The study shows that in order to ensure the repair effect of pressing particle gap in actual production,it is necessary to adjust the appropriate pressure for the different cell gap,and through the best intensity of pressure to select the appropriate diameter of head,to ensure a good repair effect.
作者 尹磊 陈平 冯川 韩海滨 李娜娜 刘涛 汤晨 YIN Lei;CHEN Ping;FENG Chuan;HAN Hai-bin;LI Na-na;LIU Tao;TANG Chen(Hefei BOE Optoelectronics Technology Co., Ltd., Heifei 230012, China)
出处 《液晶与显示》 CAS CSCD 北大核心 2021年第5期699-704,共6页 Chinese Journal of Liquid Crystals and Displays
关键词 盒厚 压头直径 按压修复 成功率 cell gap diameter of head pressing repair effect of repair
  • 相关文献

参考文献7

二级参考文献25

共引文献29

同被引文献6

引证文献1

相关作者

内容加载中请稍等...

相关机构

内容加载中请稍等...

相关主题

内容加载中请稍等...

浏览历史

内容加载中请稍等...
;
使用帮助 返回顶部