摘要
该文针对发射装置外场测试仪在外场联试中出现的敏感现象,分析干扰机理,定位了干扰源,针对干扰源提出了一系列尖峰干扰抑制措施,经电磁兼容试验验证,措施有效,解决了外场测试仪的敏感问题。
Aiming at susceptible phenomenon of outfield tester during outfield integration test,The article analyzes reason of mutual interference,locates source of interference,puts forward a set of spike suppression technologies,Though of EMC test verification,these technologies eliminate susceptible phenomenon,are certified effective.
作者
陈爱苗
Chen Ai-miao(China Airborne Missile Academy,Henan Luoyang 471099)
出处
《电子质量》
2021年第4期116-118,共3页
Electronics Quality
