摘要
MOS集成电路中,金属-氧化物半导体场效应晶体管(Metal-Oxide-Semiconductor Field-Effect Transistor,MOSFET)作为开关器件被封测公司广泛生产并应用到各个领域。从产品设计到封装成型的过程中伴随着各种可靠性问题[1]。测试工序是对产品性能最重要的检验和把关,测试数据将会把各种可靠性问题呈现出来。本文将通过具体案例对功率MOSFET产品的低导通阻抗特性中存在的可靠性问题进行数据分析和监控预警。
Among MOS integrated circuits,Metal-Oxide-Semiconductor Field-Effect Transistor(MOSFET)as a switching device is widely produced by packaging and testing companies and applied to various fields.The process from product design to packaging molding is accompanied by various reliability issues.The test process is the most important inspection and check on product performance,and the test data show various reliability problems.Specific cases are used to conduct data analysis and monitoring and early warning of reliability problems in the low on-resistance characteristics of power MOSFET products.
作者
张来柱
ZHANG Lai-zhu(Tianshui Huatian Technology Co.,Ltd.)
出处
《中国集成电路》
2021年第5期61-63,87,共4页
China lntegrated Circuit
