低冲击分离装置的加速退化试验方案研究

Study on Accelerated Degradation Test Scheme of the Low-Shock Separation Devices

本文主要设计了低冲击分离装置加速退化试验方案。首先,确定了加速退化试验的类型和性能退化参数。然后,通过分析影响低冲击分离装置性能退化的主要因素,选取了温度、湿度作为加速应力;选取Peck模型作为加速模型;通过计算加速因子,确定了应力水平组合;确定了试验样品数量及其分配比例和试验时间等试验参数。最后,给出了加速退化试验的试验步骤。

This paper mainly designs the accelerated degradation test scheme of low-shock separation devices.First,the type of accelerated degradation test and the performance parameter are determined・Then,temperature and humidity are selected as the accelerated stress by analyzing the main factors affecting the performance degradation of low-shock separation devices.Peck model is selected as the accelerated model.The combination of stress levels is determined by calculating the accelerated factor.The test parameters,such as the number of samples and their proportions,and test time are determined.Finally,the steps of accelerated degradation test are given.