某模/数转换器低温下输出异常失效分析

The Failure Analysis for A Type of A/D Converter about the Abnormal Output in Low Temperature

近些年来,关于电子元器件的失效分析的研究正变得越来越重要。通过电子元器件的失效分析,不仅可以发现设计与工艺制造的问题,且从中获取的经验还可以在相似产品上得到应用,避免后续相同或相似问题再次发生,使得同类产品可靠性得以提升。本文是关于某10位模/数转换器输出异常的失效分析。该批产品在进行筛选以及质量一致性检验过程中未发现异常,但用户在低温下测试时发现异常。将该产品退回所后用原测试系统、按照原测试方法复测仍然合格,在分析仪器有限的情况下,借助于试验、仿真等手段进行分析,发现产品存在固有缺陷,而所用测试方法由于不能发现该异常现象,因此筛选时未剔除此类缺陷。本篇文章对失效原因、失效机理进行了详细的分析,并提出了后续改进建议,对提高同类产品的可靠性具有借鉴意义。

In recent years,the study on "Failure Analysis" for the electronic component is becoming much more and more important.Through "Failure Analysis" for the electronic component,the problem in design and manufacture not only can be found,but the experience can also be used when the later similar product is designed.And the same or similar problems are avoided happening again.The reliability of the same sort of products can be improved too.This paper is about the analysis for the abnormal output of one type of 10-bit A/D converter.The first lot of 10-bit A/D converters was not found any abnormal condition during the screening and QCI.But the output is abnormal when this lot of products were tested in low temperature by consumer.The products were taken back to our institute later and tested again with the original method.The results are still eligible.But the test results are different when we changed the test method to the same one with the consumer.With limited analyzing devices,analyzing the abnormal conditions recur to the available tests and simulation,the connatural defect was found.And the defect could not be found with the original test method,so lead to the defective products were not eliminated during the screening and QCI.This paper presents the failure reason and failure mechanism in detail,and gives the suggestions for the further improvement of the same sort of products.The conclusions are instructive for the higher reliability of the similar products.