植物叶片扫描电镜样品不同处理与观察方法的研究进展

Research Progress of Different Treatment and Observation Methods of Electron Microscopy(Sem)Samples of Plant Leaf

扫描电子显微镜(ScanningElectronicMicroscope,SEM)是研究植物叶表皮结构、进行植物分类的有力工具。能否获得高质量的SEM图像,取决于样品的预处理和观察方法是否符合样本的特征。文章基于以前的研究结果和查阅的文献,介绍了SEM在植物叶表皮研究的应用现状、不同的处理及观察方法的研究进展,讨论了各种处理方法在叶表皮微形态研究上的优势及不足,以期为相关科研工作提供参考。

Scanning electronic microscope(SEM)is a powerful instrument for studying the epidermal components of leaves to classify different plants.The quality of SEM images greatly depends on whether the pre-treatment and observation methods conform to the characteristics of leaves or not.Based on our former researches and literatures reviewed,it summarized briefly here in this article that,application of SEM and progress of different treatment and observation methods developed on analysis of plant leaf epidermises.The advantages and disadvantages of different treatments are also discussed here to provide some reference for future studies.