摘要
介绍了应用单片机实现扫描式摄影点阵控制技术,及在线对发光二极管阵列进行检测的方法,并给出了该技术在光电测控设备数据记录系统中的应用,通过实例证明了该技术的实用价值。
The scanning type LEDlattice control technique based on a single chip computer is presented, and a new method of malfunction detection of the LEDlattice is introduced. It has been successful when the technique is applied to the data recording system of photoelectronic monitoring equipment , and gained good value in engineering application.
基金
中国科学院国防预研课题(JH00I11J)