原子力显微镜成像技巧的探讨

Discussion on imaging technique of atomic force microscopy

原子力显微镜(Atomic Force Microscopy,AFM)的一个重要应用是对样品表面的微纳米尺寸特征进行成像,在扫描的过程中,实际成像图是原子力探针和样品共同卷积的结果,所以探针的选择、样品的制备直接决定成像质量。本文总结了探针的弹性系数、曲率半径、悬臂镀层对成像的影响,以及制样、装样时可能存在的问题,因此为获得更准确的成像,需要克服样品可能存在的这些问题,并选择适合的探针对其成像。

One of the important applications of AFM is to image the micro nano size characteristics of the sample surface.In the scanning process,the actual image is the result of the convolution of atomic force probe and the sample,so the selection of probe and the preparation of sample directly determine the imaging quality.This paper summarizes the influence of the elastic coefficient,curvature radius and cantilever coating on the imaging of the probe,as well as the possible problems in sample preparation and loading.