30~160 keV单能X射线装置的单色性实验研究

Experimental Study on Monochromaticity of 30~160 keV Single Energy X-ray Device

单能X射线光源是由X射线光机、双晶单色器、标准探测器以及准直系统组成。X射线光机产生的连续X射线,通过与双晶单色器发生布拉格衍射完成单色化,调节不同的特定布拉格角度得到能量范围30~160 keV的单能X射线。为了研究标定装置的能量展宽,需要对该装置产生的单能X射线的能量分辨率进行研究。结果表明Si(220)晶体产生的单能X射线的能量分辨率为0.91%@30 keV和2.3%@70.6 keV,Si(551)晶体为1.97%@80.1 keV和3.45%@142.6 keV。使用这套装置对溴化镧晶体探测器的能量响应进行校准验证,实验发现该装置的能量分辨率良好,可以应用在多种类型探测器的标定实验、X射线质量衰减系数测量以及多层膜反射率测量等领域。

The single-energy X-ray source is composed of X-ray machine,double crystal Monochromator,standard detector and collimation system. The continuous X-ray produced by X-ray machine is monochromated by Bragg diffraction with double crystal monochromator. The single energy X-ray with energy range of 30 ~ 160 ke V is obtained by adjusting different Bragg angles. In order to study the energy broadening of the calibration device,it is necessary to study the energy resolution of the single energy X-ray produced by the device. The results show that the energy resolution of single energy X-ray produced by Si( 220) crystal is 0. 91% @ 30 ke V and 2. 3% @ 70. 6 ke V,Si( 551) crystal is 1. 97% @ 80. 1 ke V and 3. 45% @ 142. 6 ke V.The energy response of lanthanum bromide crystal detector is calibrated and verified by the device. The experimental results show that the device has good energy resolution and can be used in calibration experiments of various types of detectors,measurement of X-ray mass attenuation coefficient and reflectivity measurement of multilayer films.