一种基于BCH算法的SRAM PUF芯片的设计、测试与分析

The design,test and analysis of a SRAM PUF chip based on BCH algorithm

物理不可克隆功能是一种新型的信息安全硬件,在物联网、消费电子等领域得到了越来越广泛的应用。基于SRAM的PUF是工业上应用最广泛的一种类型。基于华宏0.11μm CMOS工艺的SRAM PUF,通过引入BCH算法解决了SRAM的不稳定性造成的误码率问题。通过设计单片机测试电路和PUF芯片测试板,对PUF芯片的片内汉明距离、片间汉明距离和稳定性等关键指标进行了详细的测试和分析。测试结果表明,PUF的片间汉明距离达到42.2%,片内汉明距离达到20.0%,并且具有很好地电压稳定性与温度稳定性。在BCH算法纠错机制运行的情况下芯片片内汉明距离降为0,很好地解决了PUF实现过程中的误码率问题。基于本项研究可知,通过BCH算法与SRAM单元相结合的方式可以很好地解决PUF常出现的不稳定性的问题。BCH算法与SRAM单元相结合的PUF芯片可以很好地满足识别、电子标签等应用的需要。

PUF(physically unclonable functions)is a new type of information security hardware,which has been widely used in the fields of Internet of things,consumer electronics and so on.SRAM based PUF is one of the most widely used types in industry.The SRAM PUF,based on Huahong 0.11μm CMOS process,solves the error rate problem caused by SRAM instability by introducing a BCH algorithm.Through the design of MCU test circuit and PUF chip test board,the key indexes such as in-chip hamming distance,inter-chip hamming distance and stability of PUF chip are tested and analyzed in detail.According to the test results,the hamming distance between the PUF films is 42.2%and the hamming distance within the films is 20.0%.When the error correction mechanism of the BCH algorithm is running,the hamming distance in the chip is reduced to 0,which solves the error rate problem in the process of PUF implementation.This study shows that the problem of instability can be solved by combining BCH algorithm with SRAM unit.The PUF chip combined with BCH algorithm and SRAM unit can meet the needs of recognition,electronic label and other applications.