基于测试分选机的集成电路三温量产测试系统

IC Tri-Temperature Mass Production Test System Based on Test Handler

随着集成电路的使用环境变得更加严酷,为了保证芯片在较大的温度范围内有较高的稳定性,在芯片的可靠性评价考核过程中必须对芯片进行常温、低温和高温测试(称为"三温测试")。与此同时,芯片的量产测试需要从大量的芯片中筛选出合格和不合格的芯片。为了提高测试效率和保障产品质量,提出了基于测试分选机的集成电路三温量产测试系统,并对该测试系统的构成及搭建进行了分析。针对三温量产测试给出了包括测试板设计、测试配套件开发、测试软件开发、温控时间设定和多芯片并行量产测试等关键步骤。项目研究可以为行业提供集成电路三温量产测试系统搭建及选型参考,并可以指导三温量产测试项目的实施。

As the use environment of IC becomes more severe,in order to ensure that the chip has higher stability in a larger temperature range,the room temperature,low temperature and high temperature test(called tri-temperature test)must be carried out during the reliability evaluation and assessment of the chip.At the same time,mass production testing of chips requires screening out qualified and unqualified chips from a large number of chips.In order to improve the test efficiency and ensure the product quality,an IC tri-temperature mass production test system based on test handler is put forward,and the composition and construction of the test system are analyzed.And the key steps including test board design,test kit development,test software development,temperature control time setting and multi-chip parallel mass production test are given.The project research can provide reference for the construction and selection of IC tri-temperature mass production test system,and can guide the implementation of the tri-temperature mass production test project.