摘要
像元ADC可将红外探测器的电流信号直接转换成对应数字量,在像元阵列之间以数字的方式进行传输和最终输出。本文设计了一种可实现非均匀校正和盲元补偿算法的像元级ADC,避免了在算法级进行非均匀校正和盲元补偿的方式,降低了后续图像处理算法实现的难度,减少了图像处理算法消耗的资源。所提出的像元ADC基于64×64探测器阵列进行了红外焦平面读出芯片的设计,并采用40 nm CMOS工艺进行了流片,单个像元级ADC面积≤30μm×30μm,读出芯片面积约4.5 mm×4.5 mm。流片测试结果表示该像元ADC可实现非均匀校正与盲元补偿,非均匀校正范围可达到34%。
The function of the pixel ADC is to convert the current signal of the infrared detector into a digital signal at the pixel level.This paper designs a pixel ADC that can realize non-uniformity correction and blind element compensation,which avoids the way of performing at the algorithm level,reduces the difficulty of image processing algorithms,and reduces the resources consumed by the image processing algorithms.The proposed pixel ADC is based on the 64×64 detector array to design the infrared focal plane readout circuit which is taped out on 40 nm CMOS Process.The area of pixel ADC is less than 30μm×30μm,and the area of readout circuit is about 4.5 mm×4.5 mm.The pixel ADC is proved that the realization of non-uniformity correction and blind element compensation.The non-uniformity correction range can reach 34%.
作者
曾岩
黄文刚
马敏舒
高炜祺
ZENG Yan;HUANG Wen-gang;MA Min-shu;GAO Wei-qi(Sichuan Institute of Solid-State Circuits,China Electronics Technology Group Corp.,Chongqing 400060,China)
出处
《激光与红外》
CAS
CSCD
北大核心
2021年第7期938-943,共6页
Laser & Infrared