改进后MCU测试架构及其测试策略研究

Research on improved MCU test architecture and test strategy

本文将通过对传统测试的结构进行分析,找出传统测试的缺点,并加以改进。提出改进后MCU测试构架及其测试策略,并加以分析。可以得出以下结论。改进测试架构及其测试策略的意义在于可以在提高测试准确性的同时,降低测试过程中的成本。希望可以为其他的同行业提供一些借鉴与帮助。

This paper will analyze the structure of traditional testing,find out the shortcomings of traditional testing,and improve it.The improved MCU test architecture and test strategy are proposed and analyzed.The following conclusions can be drawn.The significance of improving the test architecture and its test strategy is to improve the test accuracy and reduce the cost of the test process.Hope to provide some reference and help for other industry.