故障激发试验

Fault Excitation Test

为了加快产品设计开发周期,尽早发现产品缺陷,快速验证产品性能,由此以高加速寿命试验(Highly Accelerated Life Test,缩写为HALT)和高加速应力试验(Highly Accelerated Stress Test,缩写为HAST)为代表的故障激发试验被提出并得到广泛应用。高加速寿命试验和高加速应力试验,作为故障激发试验的典型代表在快速发现产品缺陷,缩短开发周期,改善产品可靠性方面发挥了重要作用。

In order to speed up the cycle of development and find the product defects as soon as possible and verify the product performance quickly, fault excitation test represented by High Accelerated Life Test(abbreviated as HALT)and Highly Accelerated Stress Test(abbreviated as HAST) are proposed and widely used. As the typical of Fault excitation tes, the Highly Accelerated Life Test and Highly Accelerated Stress Test play a great importance on improving product reliability by finding product defects quickly and shorting the development cycle.