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Splitting Behaviour of Implanted MeV Au^(+)Ions in LiB_(3)O_(5)

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摘要 The diffusion behaviour of 1.0 and 2.0MeV Au^(+)implanted into LiB_(3)O_(5)single crystal has been studied by the Rutherford backscattering of 2.1 MeV He ions.Annealing was performed at temperatures of 600,700,and 800℃each for 30 min.The results show that the diffusion behaviour is quite different in two cases.In LiB_(3)O_(5),the depth distribution of the 1.0MeV Au is nearly Gaussian and becomes bimodal after annealing at 800℃for 30 min.But in the case of 2.0 MeV,the depth distribution of as implanted Au^(+)in LiB_(3)O_(5)has splitting behaviour.After 800℃for 30 min annealing,there is no obvious diffusion observed.The precise interpretation is needed.
作者 WANG Ke-ming SHI Bo-rong Nelson Cue LU Fei WANG Feng-xiang XIE Zhao-xia SHEN Ding-yu LIU Yao-gang 王克明;时伯荣;Nelson Cue;卢霏;王凤翔;谢朝霞;沈定予;刘耀岗(Department of Physics,Shandong University,Ji'nan 250100;Department of Physics,Hong Kong University of Science and Technology,Hong Kong;Laboratory of Heavy Ion Physics,Peking University,Beijing 100871;Institute of Crystal Materials,Shandong University,Ji'nan 250100)
出处 《Chinese Physics Letters》 SCIE CAS CSCD 2000年第1期40-42,共3页 中国物理快报(英文版)
基金 Supported by the National Natural Science Foundation of China under Grant No.19775031,the Hong Kong University of Science and Technology Research Infracture Grant R191/92SC05 Laboratory of Heavy Ion Physics,Peking University。
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