基于阈值法的数字集成电路测试仪的研制

Development of Digital Integrated Circuit Tester Based on Threshold Method

研制了一种基于阈值法的数字集成电路测试仪,用于检测74LS10、74LS138等74LS系列芯片的性能。该测试仪采用两片STM8型微控制器作为核心单元,通过测试向量集来判断芯片的性能,测试结果输出到LCD显示屏中。实际测试结果表明:该测试仪操作灵活,测试速度快,能准确检测芯片的状态,满足芯片诊断的需求。

A digital integrated circuit tester based on threshold method was developed to detect performance of 74LS series chips such as 74LS10 and 74LS138.The tester used two stm8 micro-controllers as the core of system,with a set of test vectors to determine performance of chips.The test result was exported to the LCD display.The actual test results showed that the tester has features of flexible operation,fast testing speed,which can accurately detect the status of the chip and meet the needs of chip diagnostic.