摘要
The influence of the coherent artifact in a semiconductor Ga-doped ZnO film on femtosecond pump-probe measurement is studied.The coherent artifact mixed into the pump-probe signal can be directly inspected by detecting the background-free first-order diffraction signal induced by the interference between the pump and probe pulses.Experimental results show that by varying the polarization angle or adjusting the relative intensity between the pump and probe pulses,the coherent artifact can be eliminated from the pump-probe measurement.
作者
LIU Hui
ZHANG Hang
SI Jin-Hai
YAN Li-He
CHEN Feng
HOU Xun
刘晖;张航;司金海;闫理贺;陈烽;侯洵(Key Laboratory for Physical Electronics and Devices of the Ministry of Education&Shaanxi Key Lab of Information Photonic Technique,School of Electronics&information Engineering,Xi'an Jiaotong University,Xi'an 710049)
基金
by the National Natural Science Foundation of China under Grant No 11074197
the Specialized Research Fund for the Doctoral Program of Higher Education of China under the Grant No 200806980022。
