摘要
FexGe1−x/Ge amorphous heterojunction diodes with p-FexGe1−x ferromagnetic semiconductor layers are grown on single-crystal Ge substrates of p-type,n-type and intrinsic semiconductors,respectively.The I–V curves of p−Fe_(0.4)Ge_(0.6)/p−Ge diodes only show slight changes with temperature or with magnetic field.For the p-Fe_(0.4)Ge_(0.6)/n−Ge diode,good rectification is maintained at room temperature.More interestingly,the I–V curve of the p−Fe0.4Ge0.6/i-Ge diode can be tuned by the magnetic field,indicating a large positive magnetoresistance.The resistances of the junctions decrease with the increasing temperature,suggesting a typical semiconductor transport behavior.The origin of the positive magnetoresistance is discussed based on the effect of the electric and magnetic field on the energy band structures of the interface.
作者
秦羽丰
颜世申
康仕寿
萧淑琴
李强
代正坤
沈婷婷
代由勇
刘国磊
陈延学
梅良模
张泽
QIN Yu-Feng;YAN Shi-Shen;KANG Shi-Shou;XIAO Shu-Qin;LI Qiang;DAI Zheng-Kun;SHEN Ting-Ting;DAI You-Yong;LIU Guo-Lei;CHEN Yan-Xue;MEI Liang-Mo;ZHANG Ze(School of Physics,and National Key Laboratory of Crystal Materials,Shandong University,Jinan 250100;Department of Physics,School of Information,Shandong Agricultural University,Taian 271018;Department of Materials Science and Engineering,Zhejiang University,Hangzhou 310027)
基金
Supported by the National Basic Research Program of China under Grant Nos.2007CB924903 and 2009CB929202
the National Natural Science Foundation of China under Grant No.10974120
the Outstanding Youth Foundation of Shandong Province under Grant No.JQ200901.