摘要
The hydrogen-induced defeats in FZ silicon grown in hydrogen atmosphere hare been investigated by both the conventional and the in situ white beam synchrotron radiation topography.The formation process of the defects is discussed.
作者
MAI Zhen-hong
麦振洪;W.Graeff(Institute of Physics,Academia Sinica,Beijing;HASYLAB,DESY,Hamburg,F.R.Germany)
