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X-RAY DIFFRACTION OF Cu/Ti FIBONACCI SUPERLATTICES

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摘要 1-D quasiperiodic(Fibonacci)Cu/Ti metallic superlattices have been pared tn a dual magnetron sputter deposition system.X-ray scattering measurements of these samples are presented・The X-ray diffraction peaks at low angles can be indexed by the projection method from the high-dimensional periodic structure.In the high angle region,there is one broad peak,which indicates that the samples are amorphous.
作者 朱明 胡安 蒋树声 邱燕 冯端 Zhu Ming;HU An;JIANG Shusheng;QUI Yan;FENG Duan(Laboratory of Solid State Micro structures,Nanjing University,Nanjing)
出处 《Chinese Physics Letters》 SCIE CAS CSCD 1989年第10期469-472,共4页 中国物理快报(英文版)
基金 supported by National Natural Science Foundation of China.
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