摘要
The band alignment of a (0001)CdS/CdTe heterojunction is in situ studied by synchrotron radiation photoemission spectroscopy (SRPES).The heterojunction is formed through stepwise deposition of a CdTe film on a wurtzite (0001)CdS single crystalline substrate via molecular beam epitaxy.CdS shows an upward band bending of 0.55 eV,the valence band offset △Ev is calculated to be 0.65 e V and the conduction band offset △ Ec is 0.31 eV.The interracial band alignment is sketched to display type-Ⅰ band alignment.
基金
Supported by the National Natural Science Foundation of China(Nos 50872111,50902113,50902114)
the National Basic Research Program of China(No 2011CB610406)
the 111 Project of China(No B08040),NPU Foundation for Fundamental Research and the Research Fund of the State Key Laboratory of Solidification Processing(NWPU).
