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A Low Specific on-Resistance SOI Trench MOSFET with a Non-Depleted Embedded p-Island

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摘要 A novel silicon-on-insulator(SOI)trench metal-oxide-semiconductor field effect transistor(MOSFET)with a reduced specific on-resistance(R_(on,sp))is presented.It features an oxide-filled trench and a non-depleted embedded p-type island(p-SOI).The oxide trench folds the drift region into a U-shape,resulting in a reduction in cell pitch and R_(on,sp).The non-depleted p-island is employed to further reduce R_(on,sp) by increasing the optimized doping concentration of the drift region without deteriorating the breakdown voltage(BV).The simulation results show that the p-SOI decreases the R_(on,sp) to 10.2 mΩ·cm^(2) from 17.4 mΩ·cm^(2) of the conventional SOI MOSFET at the same BV.
作者 FAN Jie ZHANG Bo LUO Xiao-Rong LI Zhao-Ji 范杰;张波;罗小蓉;李肇基(State Key Laboratory of Electronic Thin Films and Integrated Devices,University of Electronic Science and Technology of China,Chengdu 610054)
出处 《Chinese Physics Letters》 SCIE CAS CSCD 2013年第7期243-246,共4页 中国物理快报(英文版)
基金 Supported by the National Natural Science Foundation of China under Grant Nos 61176069 and 60976060 the Foundation under Grant No 51308020304.
关键词 TRENCH SOI BREAKDOWN
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