摘要
Thin films of cadmium telluride were prepared by evaporating cadmium telluride powder in a vacuum of less than 10^(-4) Torr.The substrate temperature was varied systematically from room temperature to 300℃.The results of optical and structural characterizations have revealed that the films posses a high value of absorption coefficient with a bandgap value m the range 1.475-1.769eV,and that the films are of cubic structure with a preferred orientation along(111)plane.Four probe measurements have shown that resistivity of these films is affected by the change in substrate temperature,with the lowest value(12.6 Ω·cm)being at 200℃.
