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Enhancement Effect of Patterning Resolution Induced by an Aluminum Thermal Conduction Layer with AgInSbTe as a Laser Thermal Lithography Film

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摘要 We employ an aluminum (Al) film as a thermal conduction layer under the laser thermal lithography AgInSbTe phase-change film to improve the patterning resolution in laser thermal lithography.The patterns were fabricated by laser writing and wet-etching.The laser writing was conducted by a setup where the laser wavelength and the numerical aperture of the converging lens were 405nm and 0.90,respectively.The wet-etching was carried out in a 17wt% ammonium sulfide solution.Experimental results indicate that the patterning resolution enhancement induced by an Al thermal conduction layer is more than 20% compared with that of the samples without an Al thermal conduction layer.The analysis reveals that the resolution-enhancing effect may be due to the changes of heat diffusion directions induced by the Al thermal conduction layer.
作者 李豪 王睿 耿永友 吴谊群 魏劲松 LI Hao;WANG Rui;GENG Yong-You;WU Yi-Qun;WEI Jing-Song(Shanghai Institute of Optics and Fine Mechanics,Chinese Academy of Sciences,Shanghai 201800;Key Lab of Functional Inorganic Material Chemistry(Ministry of Education),Heilongjiang University,Harbin 150080)
出处 《Chinese Physics Letters》 SCIE CAS CSCD 2012年第7期157-159,共3页 中国物理快报(英文版)
基金 Supported by the National Natural Science Foundation of China under Grant Nos 61137002 and 61178059.
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