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Thermal Annealing Behavior of Helium in Ti Films Deposited by Magnetron Sputtering

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摘要 Helium contents of up to 30at.% are prepared in sputter-deposited Ti films.Isochronal annealing behaviors of helium including the depth profiles and the evolution of helium bubbles in the films at different temperatures are examined by ion beam analysis including Rutherford backscattering spectrometry (RBS) and elastic recoil detection analysis (ERDA),as well as thermal helium desorption spectroscopy (THDS).It is found that the energy spreading induced by structural inhomogeneities in the spectra of RBS and ERDA as well as the increment in the width of spectra occurs,which corresponds to the change of stopping cross-section of helium atoms in the Ti film due to the change of physical-state of helium in the evolution of helium bubble.The ion beam analysis on the helium evolution is consistent with the THDS measurement.Ion beam technique opens interesting possibilities in the characterizing on the growth of helium bubbles.
作者 ZHANG Lei HE Zhi-Jiang LIU Chao-Zhuo WANG Xu-Fei SHI Li-Qun 张磊;何志江;刘超卓;王旭飞;施立群(Applied Ion Beam Physics Laboratory,Institute of Modern Physics,Fudan University,Shanghai 200433)
出处 《Chinese Physics Letters》 SCIE CAS CSCD 2012年第1期64-67,共4页 中国物理快报(英文版)
基金 Supported by the National Natural Science Foundation of China under Grant No 10975035 the Special Project for ITER of China under Grant No 2010GB104002.
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