摘要
We have studied the effects ofγ-ray irradiation on electroluminescence(EL)from Au/extra thin Si-rich SiO_(2) film/p-Si Structures.Afterγ-ray irradiation,for the structure with a 600℃ annealed Si-rich SiO_(2) film a new blue EL band with a peak at around 480nm was observed,and for the structure with a 300℃ annealed Si-rich SiO_(2) film the red EL band shifts from 670 to 660nm and its intensity and full width at half maximum increase pronouncedly.The experimental results demonstrate that the defects induced byγ-ray irradiation are responsible for the blue EL band as well as for the variations of the red EL band.
基金
Supported,by the National Natural Science Foundation of China under Grant No.59432022
the State Key Laboratory for Integrated Optoelectronics。