期刊文献+

基于铜镍二级海参状微纳米层的固态键合方法

Solid state bonding method based on Cu-Ni secondary sea cucumber like micro-nano layer
下载PDF
导出
摘要 提出一种基于铜镍二级海参状微纳米层的固态键合方法。将两块基板具有海参状铜镍微纳米层的表面相互接触以形成接触区域,再在加热条件下对接触区域施加压力进行键合,其中,海参状铜镍微纳米层包括铜针层以及镀覆于该铜针层表面的镍针层,铜针层为锥形铜微米针形成的阵列层,镍针层包括锥形镍纳米针形成的阵列层以及在这些锥形镍纳米针上形成的突起。通过扫描电子显微镜和透射电子显微镜及焊接强度测试仪器分别分析了互连界面的显微组织形貌变化、键合机制和剪切强度变化趋势。结果表明:这种固态键合方法能获得高强度的互连作用力。 A solid-state bonding method based on Cu Ni secondary sea cucumber like micro nano layer was proposed.The surfaces of the two substrates with a sea cucumber like Cu Ni micro-nano layer were contacted with each other to form a contact area,and then pressure was applied to the contact area under heating conditions to bond.The sea cucumber like Cu Ni micro-nano layer included a copper needle layer and a nickel needle layer plated on the surface of the copper needle layer.The copper needle layer was an array layer formed by a tapered copper microneedle,and the nickel needle layer included an array layer formed by a tapered nickel nanoneedle and a protuberance.The microstructure,bonding mechanism and shear strength of the interface were analyzed by scanning electron microscope,transmission electron microscope and welding strength testing instrument.The results shown that this solid state bonding method can obtain high strength interconnection force.
作者 肖金 翟倩 张彬 陈伟全 Xiao Jin;Zhai Qian;Zhang Bin;Chen Weiquan(Huali College,Guangdong University of Technology,Guangzhou 511325)
出处 《化工新型材料》 CAS CSCD 北大核心 2021年第7期221-224,共4页 New Chemical Materials
基金 2019年广东省教育厅重点平台及科研项目特色创新项目(自然科学)(2019KTSCX224)。
关键词 固态键合 铜-镍微纳米 互连强度 扩散 solid state bonding Cu-Ni micro nano interconnection strength diffusion
  • 相关文献

参考文献2

二级参考文献13

  • 1翁寿松.3D封装的发展动态与前景[J].电子与封装,2006,6(1):8-11. 被引量:13
  • 2黄玉财,程秀兰,蔡俊荣.集成电路封装中的引线键合技术[J].电子与封装,2006,6(7):16-20. 被引量:36
  • 3LIUDS, CHAO YC, WANGC H. Study of wire bonding looping formation in the electronic packaging process using the three-dimensional finite element method [J]. Finite Elements in Analysis and Design, 2004, 40(3): 263-286.
  • 4The international technology roadmap for semiconductors. assembly and packaging [EB/OL]. http:// www. itrs. net/Links/2007ITRS/2007_Chapters/2007 _Assembly. pdf, 2007.
  • 5BEELEN-HENDRIKX C, VERGULD M. Trends in electronic packaging and assembly for portable consumer products [C] // IEEE Electronics Packaging Technology Conf Singapore. 2000:24-32.
  • 6GOH K S, ZHONG Z W. Two capillary solutions for ultra-fine-pitch wire bonding and insulated wire bonding [J]. Microelectronic Engineering, 2007, 84(2).. 362-367.
  • 7C, OH K S, ZHONG Z W. Investigation of ultrasonic vibrations of wire-bonding capillaries [J]. Microelectronics J, 2006, 37(2): 107-113.
  • 8郎鹏,高志方,牛艳红.3D封装与硅通孔(TSV)工艺技术[J].电子工艺技术,2009,30(6):323-326. 被引量:23
  • 9邓丹,吴丰顺,周龙早,刘辉,安兵,吴懿平.3D封装及其最新研究进展[J].微纳电子技术,2010,47(7):443-450. 被引量:21
  • 10赵璋,童志义.3D-TSV技术——延续摩尔定律的有效通途[J].电子工业专用设备,2011,40(3):10-16. 被引量:16

共引文献6

相关作者

内容加载中请稍等...

相关机构

内容加载中请稍等...

相关主题

内容加载中请稍等...

浏览历史

内容加载中请稍等...
;
使用帮助 返回顶部