辐照应力环境下CPU的可靠性分析方法

Reliability Analysis Method of CPU Under Irradiation Stress Environment

针对辐照环境下的CPU提出了利用Simulink仿真获得大量数据样本后进行可靠性分析的方法,用于评价各辐照强度下CPU的可靠度等相关指标。该方法有效解决了CPU辐照环境下退化数据不足的问题,通过试验数据结合仿真结果给出了CPU板在各辐照应力下的可靠度,通过适当调整随机变量取值范围移动速度,可更精确地给出CPU各辐照剂量处的误码率。

For the CPU under the irradiation environment,a method of reliability analysis after obtaining a large number of data samples using Simulink simulation is proposed to evaluate the reliability of the CPU under various irradiation intensities and other related indicators.This method effectively solves the problem of insufficient degradation data in the CPU irradiation environment.The reliability of the CPU board under various irradiation stresses is given through the combination of experimental data and simulation results.By appropriately adjusting the moving speed of the value range of the random variable,the bit error rate at each radiation dose of the CPU can be more accurately given.